Any distance metric
between two points
and
must satisfy:
Several specific distance measurements can be used in the feature space in the process of pattern classification.
Let
be a set of
points all
belonging to the ith class or cluster, with
. This cluster
can be represented by either all of its members
,
or the estimation of some statistic parameters, such as the mean vector and
covariance matrix of the distribution with the points treated as the samples.
The mean vector and covariance matrix of the ith distribution with
samples can be estimated as